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Digital Noise Monitoring of Defect Origin

Digital Noise Monitoring of Defect Origin

Hardcover

Series: Lecture Notes in Electrical Engineering, Book 2

Technology & EngineeringGeneral Mathematics

ISBN10: 0387717536
ISBN13: 9780387717531
Publisher: Springer Nature
Published: Jul 25 2007
Pages: 224
Weight: 1.12
Height: 0.56 Width: 6.14 Depth: 9.21
Language: English

This book explores the initial stage of the origin of the defect taking into account technical, biological, and other features of several technologies. These technologies allow the defect monitoring at the beginning of the defect origin to be performed at the expense of extracting information from the noise. This book appeals to a wide audience focused on solving numerous problems.

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