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  • Open Daily: 10am - 10pm
    Alley-side Pickup: 10am - 7pm

    3038 Hennepin Ave Minneapolis, MN
    612-822-4611

Open Daily: 10am - 10pm | Alley-side Pickup: 10am - 7pm
3038 Hennepin Ave Minneapolis, MN
612-822-4611
Defects in Sio2 and Related Dielectrics: Science and Technology

Defects in Sio2 and Related Dielectrics: Science and Technology

Pacchioni, Gianfranco
Skuja, Linards
Griscom, David L.

Paperback

Series: NATO Science Series II: Mathematics, Physics and Chemistry, Book 2

Technology & EngineeringPhysics

ISBN10: 0792366867
ISBN13: 9780792366867
Publisher: Springer Nature
Published: Dec 31 2000
Pages: 624
Weight: 1.93
Height: 1.28 Width: 6.14 Depth: 9.21
Language: English
Silicon dioxide plays a central role in most contemporary electronic and photonic technologies, from fiber optics for communications and medical applications to metal-oxide-semiconductor devices. Many of these applications directly involve point defects, which can either be introduced during the manufacturing process or by exposure to ionizing radiation. They can also be deliberately created to exploit new technologies.
This book provides a general description of the influence that point defects have on the global properties of the bulk material and their spectroscopic characterization through ESR and optical spectroscopy.

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