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Debug Automation from Pre-Silicon to Post-Silicon

Debug Automation from Pre-Silicon to Post-Silicon

Hardcover

Technology & EngineeringGeneral Computers

ISBN10: 3319093088
ISBN13: 9783319093086
Publisher: Springer
Published: Oct 9 2014
Pages: 171
Weight: 0.97
Height: 0.50 Width: 6.14 Depth: 9.21
Language: English

This book describes automated debugging approaches for the bugs and the faults which appear in different abstraction levels of a hardware system. The authors employ a transaction-based debug approach to systems at the transaction-level, asserting the correct relation of transactions. The automated debug approach for design bugs finds the potential fault candidates at RTL and gate-level of a circuit. Debug techniques for logic bugs and synchronization bugs are demonstrated, enabling readers to localize the most difficult bugs. Debug automation for electrical faults (delay faults)finds the potentially failing speedpaths in a circuit at gate-level. The various debug approaches described achieve high diagnosis accuracy and reduce the debugging time, shortening the IC development cycle and increasing the productivity of designers.

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