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Characterisation and Control of Defects in Semiconductors

Characterisation and Control of Defects in Semiconductors

Hardcover

Series: Materials, Circuits and Devices

Technology & Engineering

ISBN10: 1785616552
ISBN13: 9781785616556
Publisher: Institution Of Engineering & T
Published: Dec 16 2019
Pages: 596
Weight: 2.40
Height: 1.30 Width: 6.40 Depth: 9.40
Language: English

Understanding the formation and introduction mechanisms of defects in semiconductors is essential to understanding their properties. Although many defect-related problems have been identified and solved over the past 60 years of semiconductor research, the quest for faster, cheaper, lower power, and new kinds of electronics generates an ongoing need for new materials and properties, and so creates new defect-related challenges.

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Technology & Engineering