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Contactless VLSI Measurement and Testing Techniques

Contactless VLSI Measurement and Testing Techniques

Paperback

Technology & EngineeringGeneral Computers

Currently unavailable to order

ISBN10: 3319888196
ISBN13: 9783319888194
Publisher: Springer Nature
Published: Sep 4 2018
Pages: 93
Language: English

Provides a single-source reference on contactless probing approaches for VLSI testing and diagnostic measurement

Introduces readers to various optical contactless testing techniques, such as Electro-Optic Probing, Charge Density Probe, and Photo-emissive Probe

Discusses the applicability and adaptability of each technique, based on multilayer metallization, wafer level techniques, and invasiveness

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