• Open Daily: 10am - 10pm
    Alley-side Pickup: 10am - 7pm

    3038 Hennepin Ave Minneapolis, MN
    612-822-4611

Open Daily: 10am - 10pm | Alley-side Pickup: 10am - 7pm
3038 Hennepin Ave Minneapolis, MN
612-822-4611
The Complete Optical Metrology Reference Manual: Areal Surface Texture, ISO 25178, and Non-Contact Measurement for Zero-Defect Manufacturing Quality S

The Complete Optical Metrology Reference Manual: Areal Surface Texture, ISO 25178, and Non-Contact Measurement for Zero-Defect Manufacturing Quality S

Paperback

Technology & EngineeringPhysics

Currently unavailable to order

ISBN13: 9798182072847
Publisher: Independently Published
Pages: 368
Weight: 1.88
Height: 0.76 Width: 8.50 Depth: 11.00
Language: English
You have the instrument. You still cannot say which surface parameter explains why those parts failed in the field. This reference manual closes that gap.

The optical instruments got faster and the software got deeper, but the distance between a colored topography map and a quality decision you can defend never closed. That distance is what this book removes.

It is not a catalogue of specifications. It is a working path from the measurement question to the answer that holds up. You get the physics of light and surfaces, the full areal surface texture framework under ISO 25178, and measurement uncertainty budgets you can defend in an audit.

Every major non-contact measurement technology is treated honestly: confocal and chromatic confocal sensing, coherence scanning interferometry, focus variation, structured light, deflectometry, and digital holography. Where each one earns its place, and where it quietly fails you.

The later chapters put the methods to work on real components across automotive, aerospace, semiconductor, additive, and medical device manufacturing, then move into filtering, machine learning classification, and in-line, closed-loop production integration.

This is the book you reach for when a difficult surface challenges your definition of quality, and you need an answer that holds up.

Open it to the technique you are fighting with today, and put the data to work before the next batch ships.

Also in

Technology & Engineering