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Bias Temperature Instability for Devices and Circuits

Bias Temperature Instability for Devices and Circuits

Hardcover

Technology & EngineeringPhysics

ISBN10: 1461479088
ISBN13: 9781461479086
Publisher: Springer Nature
Published: Oct 23 2013
Pages: 810
Weight: 3.30
Height: 1.60 Width: 5.80 Depth: 9.30
Language: English
This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias temperature instability. Readers will benefit from state-of-the art coverage of research in topics such as time dependent defect spectroscopy, anomalous defect behavior, stochastic modeling with additional metastable states, multiphonon theory, compact modeling with RC ladders and implications on device reliability and lifetime.

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Technology & Engineering