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Atomic Force Microscopy: A Concise Introduction

Atomic Force Microscopy: A Concise Introduction

Hardcover

Technology & Engineering

ISBN10: 9819823099
ISBN13: 9789819823093
Publisher: World Scientific Publishing Company
Published: Mar 19 2026
Pages: 216
Weight: 1.01
Height: 0.56 Width: 6.00 Depth: 9.00
Language: English
This book offers a comprehensive and accessible introduction to atomic force microscopy (AFM) -- a fundamental technique in nanoscience, nanotechnology, and materials characterization. While the basic operating principle of AFM is straightforward, the processes of data acquisition, quantitative analysis, and interpretation require deeper scientific understanding.Designed for readers with a first-year university background in mathematics and physics, this text builds a strong foundation for mastering both the practical and theoretical aspects of AFM.

Also from

Burnham, Nancy A.

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Technology & Engineering