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Analog IC Reliability in Nanometer CMOS

Analog IC Reliability in Nanometer CMOS

Hardcover

Series: Analog Circuits and Signal Processing

Technology & Engineering

ISBN10: 1461461626
ISBN13: 9781461461623
Publisher: Springer Nature
Published: Jan 9 2013
Pages: 198
Weight: 1.00
Height: 0.70 Width: 6.30 Depth: 9.20
Language: English

This book focuses on modeling, simulation and analysis of analog circuit aging. First, all important nanometer CMOS physical effects resulting in circuit unreliability are reviewed. Then, transistor aging compact models for circuit simulation are discussed and several methods for efficient circuit reliability simulation are explained and compared. Ultimately, the impact of transistor aging on analog circuits is studied. Aging-resilient and aging-immune circuits are identified and the impact of technology scaling is discussed.

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