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Advances in X-Ray Analysis

Advances in X-Ray Analysis

Hardcover

Series: Advances in X-Ray Analysis, Book 37

Technology & EngineeringChemistry

ISBN10: 0306449013
ISBN13: 9780306449017
Publisher: Springer Nature
Published: Oct 1 1994
Pages: 784
Weight: 3.44
Height: 1.63 Width: 7.00 Depth: 10.00
Language: English
89 articles organized under the following section heads: Impact of Computers on Xray Analysis. Applications of Whole Pattern Fitting: Structure Determination, Phase Identification, Lattice Parameters. Search/Match Methods, Phase Identification. Diffraction from Single Crystals and Epitaxial Films. Xray Characterization of Films and Surface Layers. Strain and Stress Determination, Xray Fractography, Diffraction Peak Broadening Analysis. Advances in Detectors and Counting Electronics. XRD Techniques and Instrumentation, Nonambient Applications, Texture, other Applications. Xray Optics, Monochromators and Synthetic Multilayers. Total Reflection XRF Applications and Instrumentation, other XRF Techniques and Instrumentation. Mathematical Techniques in Xray Spectrometry. Geological and other Applications of XRS. Index.

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