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Atomic Force Microscopy for Energy Research

Atomic Force Microscopy for Energy Research

Hardcover

Series: Emerging Materials and Technologies

Technology & EngineeringChemistryGeneral Science

ISBN10: 103200407X
ISBN13: 9781032004075
Publisher: CRC Press
Published: May 6 2022
Pages: 441
Weight: 1.79
Height: 1.00 Width: 6.14 Depth: 9.21
Language: English

Atomic force microscopy (AFM) can be used to analyze and measure the physical properties of all kinds of materials at nanoscale in the atmosphere, liquid phase, and ultra-high vacuum environment. It has become an important tool for nanoscience research. In this book, the basic principles of functional AFM techniques and their applications in energy materials--such as lithium-ion batteries, solar cells, and other energy-related materials--are addressed.

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