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Atom Probe Microscopy

Atom Probe Microscopy

Paperback

Series: Springer Materials Science, Book 160

Technology & EngineeringGeneral Science

ISBN10: 1489989390
ISBN13: 9781489989390
Publisher: Springer Nature
Published: Jun 11 2014
Pages: 396
Weight: 1.30
Height: 0.86 Width: 6.14 Depth: 9.21
Language: English

Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instrument's capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy--including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography.

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