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2001 6th International Workshop on Statistical Methodology: Iwsm: June 10, 2001/Kyoto

2001 6th International Workshop on Statistical Methodology: Iwsm: June 10, 2001/Kyoto

Hardcover

Series: IEEE Conference Proceedings

Technology & Engineering

Currently unavailable to order

ISBN10: 0780366883
ISBN13: 9780780366886
Publisher: Inst Of Electrical & Electroni
Published: Jan 1 2001
Pages: 67
Language: English
The proceedings of the 6th International Workshop on Statistical Metrology, held in 2001. The papers cover: yield ramping methodology; metrology for statistical process control; sensor and measurement technology; spatial and temporal variation analysis methods; robust design; and more.

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