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  • Open Daily: 10am - 10pm
    Alley-side Pickup: 10am - 7pm

    3038 Hennepin Ave Minneapolis, MN
    612-822-4611

Open Daily: 10am - 10pm | Alley-side Pickup: 10am - 7pm
3038 Hennepin Ave Minneapolis, MN
612-822-4611
Spectroscopic Ellipsometry for Photovoltaics: Volume 2: Applications and Optical Data of Solar Cell Materials

Spectroscopic Ellipsometry for Photovoltaics: Volume 2: Applications and Optical Data of Solar Cell Materials

Fujiwara, Hiroyuki
Collins, Robert W.

Hardcover

Series: Springer Optical Sciences, Book 214

Technology & EngineeringGeneral Science

ISBN10: 3319951378
ISBN13: 9783319951379
Publisher: Springer Nature
Published: Jan 23 2019
Pages: 616
Weight: 2.35
Height: 1.38 Width: 6.14 Depth: 9.21
Language: English

Spectroscopic ellipsometry has been applied to a wide variety of material and device characterizations in solar cell research fields. In particular, device performance analyses using exact optical constants of component layers and direct analyses of complex solar cell structures are unique features of advanced ellipsometry methods. This second volume of Spectroscopic Ellipsometry for Photovoltaics presents various applications of the ellipsometry technique for device analyses, including optical/recombination loss analyses, real-time control and on-line monitoring of solar cell structures, and large-area structural mapping. Furthermore, this book describes the optical constants of 148 solar cell component layers, covering a broad range of materials from semiconductor light absorbers (inorganic, organic and hybrid perovskite semiconductors) to transparent conductive oxides and metals. The tabulated and completely parameterized optical constants described in this book are the most current resource that is vital for device simulations and solar cell structural analyses.

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