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Open Daily: 10am - 10pm | Alley-side Pickup: 10am - 7pm
3038 Hennepin Ave Minneapolis, MN
612-822-4611
Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization

Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization

Paperback

Technology & Engineering

Publisher Price: $79.95

ISBN10: 1606505882
ISBN13: 9781606505885
Publisher: Momentum Press
Published: Sep 15 2015
Pages: 277
Weight: 0.86
Height: 0.61 Width: 6.00 Depth: 9.00
Language: English
This book was written to explain a technique that requires an understanding of many details in order to properly obtain and interpret the data obtained. It also will serve as a reference for those who need to provide SIMS data. The book has over 200 figures and the references allow one to trace development of SIMS and understand the many details of the technique.

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