Open Daily: 10am - 10pm | Alley door pickup 10am - 7pm 3038 Hennepin Ave Minneapolis, MN
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  • Open Daily: 10am - 10pm
    Alley-side Pickup: 10am - 7pm

    3038 Hennepin Ave Minneapolis, MN
    612-822-4611

Open Daily: 10am - 10pm | Alley-side Pickup: 10am - 7pm
3038 Hennepin Ave Minneapolis, MN
612-822-4611
Reliability, Robustness and Failure Mechanisms of Led Devices: Methodology and Evaluation

Reliability, Robustness and Failure Mechanisms of Led Devices: Methodology and Evaluation

Deshayes, Yannick
Bechou, Laurent

Hardcover

Technology & Engineering

ISBN10: 1785481525
ISBN13: 9781785481529
Publisher: Iste Pr Elsevier
Published: Sep 26 2016
Pages: 172
Weight: 0.94
Height: 0.56 Width: 6.00 Depth: 9.00
Language: English

The rapid growth of the use of optoelectronic technology in Information and Communications Technology (ICT) has seen a complementary increase in the performance of such technologies. As a result, optoelectronic technologies have replaced the technology of electronic interconnections. However, the control of manufacturing techniques for optoelectronic systems is more delicate than that of microelectronic technologies.This practical resource, divided into four chapters, examines several methods for determining the reliability of infrared LED devices. The primary interest of this book focuses on methods of extracting fundamental parameters from the electrical and optical characterization of specific zones in components. Failure mechanisms are identified based on measured performance before and after aging tests. Knowledge of failure mechanisms allows formulation of degradation laws, which in turn allow an accurate lifetime distribution for specific devices to be proposed.

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