• Open Daily: 10am - 10pm
    Alley-side Pickup: 10am - 7pm

    3038 Hennepin Ave Minneapolis, MN
    612-822-4611

Open Daily: 10am - 10pm | Alley-side Pickup: 10am - 7pm
3038 Hennepin Ave Minneapolis, MN
612-822-4611
Noise Analysis and Measurement for Active Pixel Sensor Readout Methods

Noise Analysis and Measurement for Active Pixel Sensor Readout Methods

Paperback

Technology & Engineering

ISBN10: 3639361547
ISBN13: 9783639361544
Publisher: Vdm Verlag
Published: Jun 5 2011
Pages: 92
Weight: 0.32
Height: 0.22 Width: 6.00 Depth: 9.00
Language: English
A detailed experimental and theoretical investigation of noise in both current mode and voltage mode amorphous silicon (a-Si) active pixel sensors (APS) has been performed. Both flicker (1/f) and thermal are considered in this study. The experimental result in this paper emphasizes the computation of the output noise variance. The theoretical analysis shows that the voltage mode APS has an advantage over the current mode APS in terms of the flicker noise due to the operation of the readout process. The experimental data are compared to the theoretical analysis and are in good agreement.

Also in

Technology & Engineering