• Open Daily: 10am - 10pm
    Alley-side Pickup: 10am - 7pm

    3038 Hennepin Ave Minneapolis, MN
    612-822-4611

Open Daily: 10am - 10pm | Alley-side Pickup: 10am - 7pm
3038 Hennepin Ave Minneapolis, MN
612-822-4611
Noncontact Atomic Force Microscopy: Volume 2

Noncontact Atomic Force Microscopy: Volume 2

Hardcover

Series: Nanoscience and Technology

Technology & Engineering

ISBN10: 3642014941
ISBN13: 9783642014949
Publisher: Springer Nature
Published: Oct 1 2009
Pages: 401
Weight: 1.55
Height: 1.00 Width: 6.10 Depth: 9.20
Language: English

Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology.

1 different editions

Also available

Also in

Technology & Engineering