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Mos Interface Physics, Process and Characterization

Mos Interface Physics, Process and Characterization

Hardcover

Technology & Engineering

ISBN10: 1032106271
ISBN13: 9781032106274
Publisher: CRC Press
Published: Oct 12 2021
Pages: 162
Weight: 0.89
Height: 0.44 Width: 6.00 Depth: 9.00
Language: English

The electronic device based on Metal Oxide Semiconductor (MOS) structure is the most important component of a large-scale integrated circuit, and is therefore a fundamental building block of the information society. Indeed, high quality MOS structure is the key to achieving high performance devices and integrated circuits. Meanwhile, the control of interface physics, process and characterization methods determine the quality of MOS structure.

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