• Open Daily: 10am - 10pm
    Alley-side Pickup: 10am - 7pm

    3038 Hennepin Ave Minneapolis, MN
    612-822-4611

Open Daily: 10am - 10pm | Alley-side Pickup: 10am - 7pm
3038 Hennepin Ave Minneapolis, MN
612-822-4611
Metal Impurities in Silicon-Device Fabrication

Metal Impurities in Silicon-Device Fabrication

Hardcover

Series: Springer Materials Science, Book 24

Technology & EngineeringPhysics

ISBN10: 3540642137
ISBN13: 9783540642138
Publisher: Springer Nature
Published: Feb 18 2000
Pages: 270
Weight: 1.15
Height: 0.61 Width: 6.39 Depth: 9.50
Language: English
This up-to-date monograph provides a thorough review of the relevant data and properties of the transition-metal impurities generated during silicon-sample and device fabrication. The different mechanisms responsible for contamination are discussed, and a survey is given of their impact on device performance. The specific properties of the main and rare impurities in silicon are examined, as well as the detection methods and requirements in modern technology. This new edition includes important recent data and many new tables.

Also in

Technology & Engineering