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  • Open Daily: 10am - 10pm
    Alley-side Pickup: 10am - 7pm

    3038 Hennepin Ave Minneapolis, MN
    612-822-4611

Open Daily: 10am - 10pm | Alley-side Pickup: 10am - 7pm
3038 Hennepin Ave Minneapolis, MN
612-822-4611
Electromigration Inside Logic Cells: Modeling, Analyzing and Mitigating Signal Electromigration in Nanocmos

Electromigration Inside Logic Cells: Modeling, Analyzing and Mitigating Signal Electromigration in Nanocmos

Posser, Gracieli
Sapatnekar, Sachin S.
Reis, Ricardo

Hardcover

Technology & EngineeringGeneral Computers

ISBN10: 3319488988
ISBN13: 9783319488981
Publisher: Springer Nature
Published: Dec 16 2016
Pages: 118
Weight: 0.83
Height: 0.38 Width: 6.14 Depth: 9.21
Language: English

This book describes new and effective methodologies for modeling, analyzing and mitigating cell-internal signal electromigration in nanoCMOS, with significant circuit lifetime improvements and no impact on performance, area and power. The authors are the first to analyze and propose a solution for the electromigration effects inside logic cells of a circuit. They show in this book that an interconnect inside a cell can fail reducing considerably the circuit lifetime and they demonstrate a methodology to optimize the lifetime of circuits, by placing the output, Vdd and Vss pin of the cells in the less critical regions, where the electromigration effects are reduced. Readers will be enabled to apply this methodology only for the critical cells in the circuit, avoiding impact in the circuit delay, area and performance, thus increasing the lifetime of the circuit without loss in other characteristics.

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