Open Daily: 10am - 10pm | Alley door pickup 10am - 7pm 3038 Hennepin Ave Minneapolis, MN
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  • Open Daily: 10am - 10pm
    Alley-side Pickup: 10am - 7pm

    3038 Hennepin Ave Minneapolis, MN
    612-822-4611

Open Daily: 10am - 10pm | Alley-side Pickup: 10am - 7pm
3038 Hennepin Ave Minneapolis, MN
612-822-4611
Using Time-Resolved Photoluminescence to Measure the Excitation and Temperature Dependence of Carrier Relaxation in Mid-Wave Infrared Semiconductors

Using Time-Resolved Photoluminescence to Measure the Excitation and Temperature Dependence of Carrier Relaxation in Mid-Wave Infrared Semiconductors

Cumblidge, Kevin

Paperback

Technology & EngineeringGeneral EducationPhysics

ISBN10: 1288315708
ISBN13: 9781288315703
Publisher: Biblioscholar
Published: Nov 19 2012
Pages: 64
Weight: 0.23
Height: 0.13 Width: 6.14 Depth: 9.21
Language: English

Research in the field of mid-wave infrared (MWIR) semiconductor photonic devices has led to applications in a variety of disciplines including atmospheric monitoring, optical communications, noninvasive glucose testing for diabetics, and infrared (IR) countermeasures. One of the limiting factors for improving the modulation rates of MWIR devices is the carrier relaxation time. This is the time required for energetic carriers to cool to the edge of their respective bands in a bulk semiconductor material, or to the bottom of a well through interand intrasubband scattering in a quantum well (QW) structure. From these lower energy states, they can then recombine radiatively in photonic devices. This investigation utilized the nonlinear optical technique of frequency upconversion to perform timeresolved luminescence spectroscopy on epitaxial bulk InAs, InAsSb/InAlAsSb type I QW structure, and InAs/GaInSb type II QW samples to calculate carrier relaxation times in each as a function of excitation irradiance and sample temperature.

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