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Characterization and Measurement of Passive and Active Metamaterial Devices

Characterization and Measurement of Passive and Active Metamaterial Devices

Paperback

Technology & EngineeringGeneral Education

ISBN10: 1249594987
ISBN13: 9781249594987
Publisher: Biblioscholar
Published: Oct 9 2012
Pages: 244
Weight: 0.76
Height: 0.51 Width: 6.14 Depth: 9.21
Language: English

This document addresses two major obstacles facing metamaterial development: uncertainty in the characterization of electromagnetic field behavior in metamaterial structures and the relatively small operational bandwidth of metamaterial structures. To address the first obstacle, a new method to characterize electromagnetic field behavior in a metamaterial is presented. This new method is a bistatic radar cross section (RCS) measurement technique. RCS measurements are well-suited to measuring bulk metamaterial samples because they show frequency dependence of scattering angles and offer common postprocessing techniques that can be useful for visualizing results.

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