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Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard

Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard

Paperback

Series: Frontiers in Electronic Testing, Book 22

Medical ReferenceTechnology & EngineeringGeneral Computers

ISBN10: 1441953159
ISBN13: 9781441953155
Publisher: Springer Nature
Published: Dec 9 2010
Pages: 178
Weight: 0.61
Height: 0.41 Width: 6.14 Depth: 9.21
Language: English

Minimization of power dissipation in very large scale integrated (VLSI) circuits is important to improve reliability and reduce packaging costs. While many techniques have investigated power minimization during the functional (normal) mode of operation, it is important to examine the power dissipation during the test circuit activity is substantially higher during test than during functional operation. For example, during the execution of built-in self-test (BIST) in-field sessions, excessive power dissipation can decrease the reliability of the circuit under test due to higher temperature and current density.

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