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Particle and Particle Systems Characterization: Small-Angle Scattering (Sas) Applications

Particle and Particle Systems Characterization: Small-Angle Scattering (Sas) Applications

Paperback

Technology & EngineeringPhysics

ISBN10: 0367576252
ISBN13: 9780367576257
Publisher: CRC Press
Published: Jun 30 2020
Pages: 348
Weight: 1.32
Height: 0.80 Width: 6.10 Depth: 9.10
Language: English

Small-angle scattering (SAS) is the premier technique for the characterization of disordered nanoscale particle ensembles. SAS is produced by the particle as a whole and does not depend in any way on the internal crystal structure of the particle. Since the first applications of X-ray scattering in the 1930s, SAS has developed into a standard method in the field of materials science. SAS is a non-destructive method and can be directly applied for solid and liquid samples.

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