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Particle and Particle Systems Characterization: Small-Angle Scattering (Sas) Applications

Particle and Particle Systems Characterization: Small-Angle Scattering (Sas) Applications

Hardcover

Technology & EngineeringPhysics

ISBN10: 1466581778
ISBN13: 9781466581777
Publisher: CRC Press
Published: Nov 22 2013
Pages: 336
Weight: 1.80
Height: 1.30 Width: 6.20 Depth: 9.20
Language: English

Small-angle scattering (SAS) is the premier technique for the characterization of disordered nanoscale particle ensembles. SAS is produced by the particle as a whole and does not depend in any way on the internal crystal structure of the particle. Since the first applications of X-ray scattering in the 1930s, SAS has developed into a standard method in the field of materials science. SAS is a non-destructive method and can be directly applied for solid and liquid samples.

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