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  • Open Daily: 10am - 10pm
    Alley-side Pickup: 10am - 7pm

    3038 Hennepin Ave Minneapolis, MN
    612-822-4611

Open Daily: 10am - 10pm | Alley-side Pickup: 10am - 7pm
3038 Hennepin Ave Minneapolis, MN
612-822-4611
Characterization Problems Associated with the Exponential Distribution

Characterization Problems Associated with the Exponential Distribution

Olkin, I.
Azlarov, T. A.
Stein, M.

Paperback

Probability & Statistics

ISBN10: 146129374X
ISBN13: 9781461293743
Publisher: Springer
Published: Oct 1 2011
Pages: 137
Weight: 0.48
Height: 0.32 Width: 6.14 Depth: 9.21
Language: English
Problems of calculating the reliability of instruments and systems and the development of measures to increase efficiency and reduce operational costs confronted physicists and mathe- maticians at the end of the '40's and the beginning of the '50's in connection with the unrelia- bility of electro-vacuum instruments used in aviation. Since then steadily increasing demands for the accuracy, reliability and complexity required in electronic equipment have served as a stimulus in the development of the theory of reliability. From 1950 to 1955 Epstein and Sobel [67,68] and Davis [62], in an analysis of statistical data of the operating time of an instrument up to failure, showed that the distribution is exponential in many cases. Consequently, the ex- ponential distribution became basic to research associated with experiments on life expectancy. Further research has shown that there are a whole series of problems in reliability theory for which the exponential distribution is inapplicable. However, it can practically always be used as a first approximation. The ease of computational work due to the nice properties of the exponential distribution (for example, the lack of memory property, see Section 1) is also a reason for its frequent use. AB a rule, data on the behavior of the failure rate function are used to test the hypothesis that a given distribution belongs to the class of exponential distributions, and order statistics are used to estimate the parameter of the exponential distribution.

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