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X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures

X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures

Hardcover

Series: Springer Tracts in Modern Physics, Book 199

Technology & EngineeringPhysics

ISBN10: 3540201793
ISBN13: 9783540201793
Publisher: Springer
Published: Jan 9 2004
Pages: 204
Weight: 1.15
Height: 0.70 Width: 6.30 Depth: 9.40
Language: English

This monograph represents a critical survey of the outstanding capabilities of X-ray
diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevance at semiconductor layer systems where, for example, interface roughness or low-dimensional objects such as quantum dots and quantum wires have attracted much interest. An extensive overview of the present state-of-the-art theory of X-ray diffuse scattering at mesoscopic structures is given followed by a valuable description of various experimental techniques. Selected up-to-date examples are discussed. The aim of the present book is to combine aspects of self-organized growth of mesoscopic structures with corresponding X-ray diffuse scattering experiments.

Also from

Schmidbauer, Martin

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Physics