• Open Daily: 10am - 10pm
    Alley-side Pickup: 10am - 7pm

    3038 Hennepin Ave Minneapolis, MN
    612-822-4611

Open Daily: 10am - 10pm | Alley-side Pickup: 10am - 7pm
3038 Hennepin Ave Minneapolis, MN
612-822-4611
VLSI Design and Test: 21st International Symposium, Vdat 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers

VLSI Design and Test: 21st International Symposium, Vdat 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers

Paperback

Series: Communications in Computer and Information Science, Book 711

General ComputersOperating Systems

ISBN10: 9811074690
ISBN13: 9789811074691
Publisher: Springer Nature
Published: Dec 22 2017
Pages: 815
Weight: 2.54
Height: 1.67 Width: 6.14 Depth: 9.21
Language: English

This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017.
The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.

Also in

General Computers