• Open Daily: 10am - 10pm
    Alley-side Pickup: 10am - 7pm

    3038 Hennepin Ave Minneapolis, MN
    612-822-4611

Open Daily: 10am - 10pm | Alley-side Pickup: 10am - 7pm
3038 Hennepin Ave Minneapolis, MN
612-822-4611
Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents

Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents

Hardcover

Series: Nanoscience and Technology

Technology & EngineeringGeneral Science

Currently unavailable to order

ISBN10: 0387400907
ISBN13: 9780387400907
Publisher: Springer Nature
Published: Jun 28 2006
Pages: 282
Weight: 1.30
Height: 0.69 Width: 6.14 Depth: 9.21
Language: English

Scanning Probe Microscopy is a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Writing in a tutorial style, the authors explain from scratch the theory behind today's simulation techniques and give examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data. The book provides the first comprehensive framework for electron transport theory with its various degrees of approximations, thus allowing extensive insight into the physics of scanning probes. Experimentalists will appreciate how the materials properties influence the instrument's operation, and theorists will understand how simulations can be directly compared to experimental data.

1 different editions

Also available

Also in

General Science