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612-822-4611
Secondary Ion Mass Spectrometry: Fundamentals, Advancements and Applications

Secondary Ion Mass Spectrometry: Fundamentals, Advancements and Applications

Hardcover

Series: New Developments in Mass Spectrometry, Book 16

ChemistryGeneral Science

Currently unavailable to order

ISBN10: 1837671001
ISBN13: 9781837671007
Publisher: Royal Society of Chemistry
Published: Jun 6 2025
Pages: 560
Weight: 2.20
Height: 1.50 Width: 6.20 Depth: 9.30
Language: English

Secondary ion mass spectrometry (SIMS) is a technique used to analyse the composition of solid surfaces and thin films by sputtering the surface of the specimen with a primary ion beam and collecting and analysing ejected secondary ions. The technique has been applied to quality assurance in semiconductor manufacture, in forensics for enhancement of fingerprints and to determine the composition of cometary dust.

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Chemistry