Open Daily: 10am - 10pm | Alley door pickup 10am - 7pm 3038 Hennepin Ave Minneapolis, MN
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  • Open Daily: 10am - 10pm
    Alley-side Pickup: 10am - 7pm

    3038 Hennepin Ave Minneapolis, MN
    612-822-4611

Open Daily: 10am - 10pm | Alley-side Pickup: 10am - 7pm
3038 Hennepin Ave Minneapolis, MN
612-822-4611
Secondary Ion Mass Spectrometry and Its Application to Materials Science (Second Edition)

Secondary Ion Mass Spectrometry and Its Application to Materials Science (Second Edition)

Fearn, Sarah
Shard, Alexander

Hardcover

Series: Iop eBooks

Technology & EngineeringGeneral Science

ISBN10: 0750333294
ISBN13: 9780750333290
Publisher: Institute of Physics Publishing
Published: Aug 26 2025
Pages: 125
Weight: 0.92
Height: 0.31 Width: 7.00 Depth: 10.00
Language: English

In this edition of Secondary Ion Mass Spectrometry (SIMS) and its Application to Material Science the authors expand further on the principles and methods presented in the first edition. A more detailed overview of the principles of SIMS is given, and of how the development of dual-beam instruments has blurred the traditional fields of dynamic and static SIMS to enable greater analytical possibilities. In particular the development and application of cluster ion beams, and how this has opened up a new area of materials analysis. Practical information on how to obtain high quality SIMS data, and what parameters should be used to define this are also considered.

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