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Secondary Ion Mass Spectrometry Sims II: Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (Sims II) Stanford Univ

Secondary Ion Mass Spectrometry Sims II: Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (Sims II) Stanford Univ

Paperback

Series: Springer Chemical Physics, Book 9

ChemistryGeneral Photography

ISBN10: 3642618731
ISBN13: 9783642618734
Publisher: Springer Nature
Published: Dec 13 2011
Pages: 300
Weight: 0.95
Height: 0.67 Width: 6.00 Depth: 9.00
Language: English
This volume contains the proceedings of the Tenth International Converence on Secondary Ion Mass Spectrometry (SIMS X). It covers a diverse field of research ranging from environmental problems to depth profiling and semiconductors. In doing so, it provides an excellent overview of current research and technology by acknowledged experts in their specialised fields.

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Chemistry