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Quantum Metrology with Photoelectrons: Volume II: Applications and Advances

Quantum Metrology with Photoelectrons: Volume II: Applications and Advances

Hardcover

Series: Iop Concise Physics

General SciencePhysics

ISBN10: 1643270001
ISBN13: 9781643270005
Publisher: Morgan & Claypool
Published: Apr 20 2018
Pages: 125
Weight: 0.97
Height: 0.38 Width: 7.00 Depth: 10.00
Language: English

Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 2: Applications and Advances discusses the fundamental concepts along with recent and emerging applications.

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