Open Daily: 10am - 10pm | Alley door pickup 10am - 7pm 3038 Hennepin Ave Minneapolis, MN
612-822-4611

  • Open Daily: 10am - 10pm
    Alley-side Pickup: 10am - 7pm

    3038 Hennepin Ave Minneapolis, MN
    612-822-4611

Open Daily: 10am - 10pm | Alley-side Pickup: 10am - 7pm
3038 Hennepin Ave Minneapolis, MN
612-822-4611
Quantitative X-Ray Diffractometry

Quantitative X-Ray Diffractometry

Zevin, Lev S.
Mureinik, Inez
Kimmel, Giora

Paperback

Technology & EngineeringChemistryPhysics

ISBN10: 1461395372
ISBN13: 9781461395379
Publisher: Springer Nature
Published: Dec 27 2011
Pages: 372
Weight: 1.39
Height: 0.82 Width: 6.69 Depth: 9.61
Language: English
One of the most important techniques for determining the atomic structure of a material is X-ray diffraction. One of the great problems of the technique, however, is the fact that only the intensity of the diffraction pattern can be measured, not its phase. The inverse problem, of determining the structure from the pattern thus contains ambiguities that must be resolved by other means. Quantitative X-ray analysis provides one way to resolve this phase problem: mixing the material in question with a material of known structure yields interferences that can be analyzed to yield the unknown phases. Invented in 1916, but little used at the time, the technique has seen a recent revival due to the development of extremely precise X-ray diffractometers coupled with powerful computers.

Also in

Chemistry

View All