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Neutron and X-ray Reflectometry: Emerging phenomena at heterostructure interfaces

Neutron and X-ray Reflectometry: Emerging phenomena at heterostructure interfaces

Hardcover

Physics

ISBN10: 0750346930
ISBN13: 9780750346931
Publisher: Institute of Physics Publishing
Published: Dec 27 2022
Pages: 200
Weight: 1.18
Height: 0.44 Width: 7.00 Depth: 10.00
Language: English

The field of ultra-thin films, a subgroup of nanomaterials, has seen an upsurge in research within the last 30 years. Studies have primarily been done using neutron and x-ray reflectometry. The technique of polarized neutron reflectometry or PNR is a unique non-destructive tool to understand thin film magnetism in mesoscopic length scale.

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Physics