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Open Daily: 10am - 10pm | Alley-side Pickup: 10am - 7pm
3038 Hennepin Ave Minneapolis, MN
612-822-4611
Modern Interferometry for Length Metrology: Exploring limits and novel techniques

Modern Interferometry for Length Metrology: Exploring limits and novel techniques

Paperback

Series: Iop Expanding Physics

Physics

ISBN10: 0750319445
ISBN13: 9780750319447
Publisher: Institute of Physics Publishing
Published: Dec 21 2018
Pages: 326
Weight: 1.25
Height: 0.68 Width: 7.00 Depth: 10.00
Language: English

Modern Interferometry for Length Metrology: Exploring limits and novel techniques gives an overview of refined traditional methods and novel techniques in the field of length and distance metrology. The representation of a length according to the definition of the meter in the International System of Units (SI) requires a measurement principle that establishes a relation between the travelling time of light in vacuum and the length to be measured. This comprehensive book covers the basic concepts of length metrology, sophisticated methods to reach smallest measurement uncertainties in length measurements and innovative interferometer concepts. Aimed at students, researchers and practitioners in the field, this book will provide a far-reaching audience with key data, enabling them to better apply and understand interferometry and length metrology.

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Physics