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Open Daily: 10am - 10pm | Alley-side Pickup: 10am - 7pm
3038 Hennepin Ave Minneapolis, MN
612-822-4611
Microscopy of Semiconducting Materials: Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK

Microscopy of Semiconducting Materials: Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK

Paperback

Series: Springer Proceedings in Physics, Book 107

Technology & EngineeringPhysics

ISBN10: 3642068707
ISBN13: 9783642068706
Publisher: Springer
Published: Oct 19 2010
Pages: 540
Weight: 1.70
Height: 1.13 Width: 6.14 Depth: 9.21
Language: English

The 14th conference in the series focused on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy. The latest developments in the use of other important microcharacterisation techniques were also covered and included the latest work using scanning probe microscopy and also X-ray topography and diffraction.

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Physics