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Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications

Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications

Paperback

Series: Springer Materials Science, Book 85

Technology & EngineeringGeneral SciencePhysics

ISBN10: 3642064531
ISBN13: 9783642064531
Publisher: Springer Nature
Published: Oct 19 2010
Pages: 492
Weight: 1.59
Height: 1.05 Width: 6.14 Depth: 9.21
Language: English

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Physics