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Ion Beam Analysis: Fundamentals and Applications

Ion Beam Analysis: Fundamentals and Applications

Paperback

Technology & EngineeringGeneral SciencePhysics

ISBN10: 0367445840
ISBN13: 9780367445843
Publisher: CRC Press
Published: Nov 25 2019
Pages: 472
Weight: 1.50
Height: 1.00 Width: 6.10 Depth: 9.10
Language: English

Ion Beam Analysis: Fundamentals and Applications explains the basic characteristics of ion beams as applied to the analysis of materials, as well as ion beam analysis (IBA) of art/archaeological objects. It focuses on the fundamentals and applications of ion beam methods of materials characterization.

The book explains how ions interact with solids and describes what information can be gained. It starts by covering the fundamentals of ion beam analysis, including kinematics, ion stopping, Rutherford backscattering, channeling, elastic recoil detection, particle induced x-ray emission, and nuclear reaction analysis. The second part turns to applications, looking at the broad range of potential uses in thin film reactions, ion implantation, nuclear energy, biology, and art/archaeology.

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