Open Daily: 10am - 10pm | Alley door pickup 10am - 7pm 3038 Hennepin Ave Minneapolis, MN
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  • Open Daily: 10am - 10pm
    Alley-side Pickup: 10am - 7pm

    3038 Hennepin Ave Minneapolis, MN
    612-822-4611

Open Daily: 10am - 10pm | Alley-side Pickup: 10am - 7pm
3038 Hennepin Ave Minneapolis, MN
612-822-4611
High Resolution X-Ray Diffractometry and Topography

High Resolution X-Ray Diffractometry and Topography

Bowen, D. K.
Tanner, Brian K.

Paperback

ChemistryPhysics

ISBN10: 0367400634
ISBN13: 9780367400637
Publisher: CRC Press
Published: Oct 10 2019
Pages: 264
Weight: 0.95
Height: 0.70 Width: 6.80 Depth: 9.50
Language: English
The study and application of electronic materials has created an increasing demand for sophisticated and reliable techniques for examining and characterizing these materials. This comprehensive book looks at the area of x-ray diffraction and the modern techniques available for deployment in research, development, and production. It provides the theoretical and practical background for applying these techniques in scientific and industrial materials characterization. The main aim of the book is to map the theoretical and practical background necessary to the study of single crystal materials by means of high-resolution x-ray diffraction and topography. It combines mathematical formalisms with graphical explanations and hands-on practical advice for interpreting data.

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