Open Daily: 10am - 10pm | Alley door pickup 10am - 7pm 3038 Hennepin Ave Minneapolis, MN
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  • Open Daily: 10am - 10pm
    Alley-side Pickup: 10am - 7pm

    3038 Hennepin Ave Minneapolis, MN
    612-822-4611

Open Daily: 10am - 10pm | Alley-side Pickup: 10am - 7pm
3038 Hennepin Ave Minneapolis, MN
612-822-4611
High Resolution X-Ray Diffractometry And Topography

High Resolution X-Ray Diffractometry And Topography

Bowen, D. K.
Tanner, Brian K.

Hardcover

ChemistryPhysics

ISBN10: 0850667585
ISBN13: 9780850667585
Publisher: CRC Press
Published: Feb 5 1998
Pages: 262
Weight: 1.16
Height: 0.83 Width: 6.40 Depth: 9.56
Language: English
The rapid growth in the applications of electronic materials has created an increasing demand for reliable techniques for examining and characterizing these materials. This book explores the area of x-ray diffraction and the techniques available for deployment in research, development, and production. It maps the theoretical and practical background necessary to study single crystal materials using high resolution x-ray diffraction and topography. It combines mathematical formalism with graphical explanations and hands-on advice for interpreting data, thus providing the theoretical and practical background for applying these techniques in scientific and industrial materials characterization.

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