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High Quality Test Pattern Generation and Boolean Satisfiability

High Quality Test Pattern Generation and Boolean Satisfiability

Paperback

Technology & EngineeringGeneral Computers

ISBN10: 1489988475
ISBN13: 9781489988478
Publisher: Springer Nature
Published: Oct 20 2014
Pages: 193
Weight: 0.67
Height: 0.45 Width: 6.14 Depth: 9.21
Language: English

This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT). A fast and highly fault efficient SAT-based ATPG framework is presented which is also able to generate high-quality delay tests such as robust path delay tests, as well as tests with long propagation paths to detect small delay defects.

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