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Full Field Optical Metrology and Applications

Full Field Optical Metrology and Applications

Hardcover

Series: Iop Advances in Optics, Photonics and Optoelectronics

Physics

ISBN10: 0750330252
ISBN13: 9780750330251
Publisher: Institute of Physics Publishing
Published: Dec 29 2022
Pages: 180
Weight: 1.77
Height: 0.81 Width: 7.00 Depth: 10.00
Language: English

Full Field Optical Metrology methods and techniques have been in existence since the first interferometry experiments by Thomas Young in the 19th Century. This book introduces non-contact optical techniques based on the speckle effect in more detail. It also covers surface metrology and explores other characteristics related to the surface, such as strain, stress, vibration, contouring, and its x, y, and z displacements (coupled as vectors in 2D and 3D). In addition, the book presents modern methods for phase retrieval, optical coherence tomography (OCT), and the moiré method.

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Physics