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  • Open Daily: 10am - 10pm
    Alley-side Pickup: 10am - 7pm

    3038 Hennepin Ave Minneapolis, MN
    612-822-4611

Open Daily: 10am - 10pm | Alley-side Pickup: 10am - 7pm
3038 Hennepin Ave Minneapolis, MN
612-822-4611
Electromigration

Electromigration

Li, Linghong

Paperback

Physics

ISBN10: 3639088131
ISBN13: 9783639088137
Publisher: Blues Kids Of Amer
Published: Oct 10 2008
Pages: 76
Weight: 0.25
Height: 0.16 Width: 6.00 Depth: 9.00
Language: English
Electromigration is a microscopic phenomenon involving electric field-induced diffusion, which is very relevant to damage in interconnections. A common method for monitoring interconnection degradation is through electrical resistance measurements, which requires direct electrical contact. It is desirable to develop non-contact methods to monitor electromigration damage formation. In this thesis, we propose a novel Optical Microscopy Imaging Method (OMIM), and we provide a theoretical description and experimental results. OMIM not only pro-vides a new method for studying electromigration, but also provides a useful method for studying other micro-devices and materials in a non-contact mode.

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