Open Daily: 10am - 10pm | Alley door pickup 10am - 7pm 3038 Hennepin Ave Minneapolis, MN
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  • Open Daily: 10am - 10pm
    Alley-side Pickup: 10am - 7pm

    3038 Hennepin Ave Minneapolis, MN
    612-822-4611

Open Daily: 10am - 10pm | Alley-side Pickup: 10am - 7pm
3038 Hennepin Ave Minneapolis, MN
612-822-4611
Electron Microscopy I - Proceedings of the 5th Asia-Pacific Electron Microscopy Conference

Electron Microscopy I - Proceedings of the 5th Asia-Pacific Electron Microscopy Conference

Kuo, K. H.
Zhai, Z. H.

Hardcover

Technology & EngineeringGeneral Science

ISBN10: 9810209983
ISBN13: 9789810209988
Publisher: World Scientific Publishing Company
Published: Jul 1 1992
Pages: 660
Weight: 4.42
Height: 1.94 Width: 8.00 Depth: 10.00
Language: English

Contents: Some Aspects of Present and Future High Resolution Electron Microscopy and Image Processing (H Hashimoto); Imaging Defects by TEM and SEM (P B Hirsch); Electron Microscopy and Science (E Zeitler); The Significance of Electron Microscopy in Materials Science and Engineering (G Thomas); Defects Characteristics Identification by Means of the Convergent-Beam Electron Diffraction and Imaging Technique (K H Kuo & R H Wang); STM Image Artifacts Studied by Combined In-Situ STM-REM (J C H Spence & W Lo); In Situ REM Study of Structural Transformations on Si Surfaces (A L Aseev et al.); Incoherence Effects in Reflection Electron Microscopy (A Howie et al.); Reflection Electron Holography of Single Crystal Surfaces (H Banzhof et al.); Quantitative Analysis of Electron Diffraction with Imaging Plate (D Shindo et al.); Determination of the Displacement Vector at a Stacking Fault Using Convergent-Beam Electron Diffraction (M Tanaka et al.); Quantitative Structure Images of Crystal Surfaces and Interfaces (M Shiojiri); High Resolution Electron Microscopy of Dislocations in Compound Crystals (K Suzuki & S Takeuchi); TEM-Investigation of an Electron-Irradiated Fe-Cr-Ni Alloy (S Yamamoto & Y Ishida); and other papers;

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