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Design for Manufacturability and Yield for Nano-Scale CMOS

Design for Manufacturability and Yield for Nano-Scale CMOS

Paperback

Series: Integrated Circuits and Systems

General ComputersProgramming

ISBN10: 9048173035
ISBN13: 9789048173037
Publisher: Springer Nature
Published: Nov 22 2010
Pages: 255
Weight: 0.90
Height: 0.60 Width: 6.14 Depth: 9.21
Language: English

Manufacturability and yield are no longer a fabrication, packaging, and test concerns. They are aspects that have to be designed in, and they are everybody's responsibility. Design for Manufacturability and Yield for Nano-Scale CMOS walks the reader through all the aspects of manufacturability and yield in a nano-CMOS process and how to address each aspect at the proper design step starting with the layout of standard cells and how to yield-grade libraries for critical area and lithography artifacts through place and route, CMP model based simulation and dummy-fill insertion, and through statistical timing closure of the design. It alerts the designer to the pitfalls to watch for and to the good practices that can enhance a design's manufacturability and yield. A must read book for the serious designer.

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General Computers