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Design for Manufacturability and Yield for Nano-Scale CMOS

Design for Manufacturability and Yield for Nano-Scale CMOS

Hardcover

Series: Integrated Circuits and Systems

Technology & EngineeringGeneral Computers

ISBN10: 1402051875
ISBN13: 9781402051876
Publisher: Springer Nature
Published: Jul 26 2007
Pages: 255
Weight: 1.50
Height: 0.69 Width: 6.47 Depth: 9.36
Language: English

Manufacturability and yield are no longer a fabrication, packaging, and test concerns. They are aspects that have to be designed in, and they are everybody's responsibility. Design for Manufacturability and Yield for Nano-Scale CMOS walks the reader through all the aspects of manufacturability and yield in a nano-CMOS process and how to address each aspect at the proper design step starting with the layout of standard cells and how to yield-grade libraries for critical area and lithography artifacts through place and route, CMP model based simulation and dummy-fill insertion, and through statistical timing closure of the design. It alerts the designer to the pitfalls to watch for and to the good practices that can enhance a design's manufacturability and yield. A must read book for the serious designer.

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