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Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications

Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications

Hardcover

Technology & EngineeringGeneral Science

ISBN10: 0470638826
ISBN13: 9780470638828
Publisher: Wiley
Published: Sep 24 2012
Pages: 496
Weight: 1.75
Height: 1.20 Width: 6.20 Depth: 9.30
Language: English
This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). The material becomes progressively more complex throughout the book, explaining details of calibration, physical origin of artifacts, and signal/noise limitations. Coverage spans imaging, materials property characterization, in-liquid interfacial analysis, tribology, and electromagnetic interactions.

Supplementary material for this book can be found by entering ISBN 9780470638828 on booksupport.wiley.com

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