• Open Daily: 10am - 10pm
    Alley-side Pickup: 10am - 7pm

    3038 Hennepin Ave Minneapolis, MN
    612-822-4611

Open Daily: 10am - 10pm | Alley-side Pickup: 10am - 7pm
3038 Hennepin Ave Minneapolis, MN
612-822-4611
Atomno-Silovaya Mikroskopiya Nanostrukturirovannykh Poverkhnostey

Atomno-Silovaya Mikroskopiya Nanostrukturirovannykh Poverkhnostey

Paperback

Physics

Currently unavailable to order

ISBN10: 3844358145
ISBN13: 9783844358148
Publisher: Lap Lambert Academic Pub
Published: Jul 11 2011
Pages: 136
Weight: 0.46
Height: 0.32 Width: 6.00 Depth: 9.00
Language: Russian
Vysokokachestvennaya polirovka i posleduyushchee nanoteksturirovanie yavlyayutsya neobkhodimymi etapami pri podgotovke podlozhek dlya sozdaniya na ikh osnove tselogo ryada ustroystv, takikh kak silovye SVCh tranzistory, sverkhyarkie svetodiody na osnove epitaksial'nykh geterostruktur; lazernye giroskopy, ul'trafioletovye litografy i sistemy upravleniya rentgenovskimi puchkami na osnove mnogosloynykh interferentsionnykh zerkal'nykh pokrytiy. Predlagaemaya Vashemu vnimaniyu kniga budet interesna issledovatelyam, zanyatym problemami sozdaniya, issledovaniya i sertifikatsii takikh podlozhek. V knige opisany osobennosti metodologii issledovaniya sverkhgladkikh poverkhnostey metodom atomno-silovoy mikroskopii, kotoryy priobretaet vse bol'shee rasprostranenie blagodarya vysokomu prostranstvennomu razresheniyu i tsenovoy dostupnosti. Osoboe vnimanie udelyaetsya dielektricheskim podlozhkam: vliyaniyu na ASM- izobrazheniya staticheskogo zaryada poverkhnosti i sposobu ego ustraneniya. Opisany metody statisticheskoy obrabotki ASM dannykh s ispol'zovaniem spektral'nogo analiza vysot sherokhovatosti, pozvolyayushchie sopostavlyat' dannye ASM s drugimi metodami issledovaniya poverkhnosti: rentgenovskim i svetovym rasseyaniem.

Also in

Physics